PA120MET: Upright Inspection Microscopes for Industrial/ Metallurgical Applications

Motic's PA120MET series microscopes feature a flexible, modular design that can be suited to your specific industrial inspection application. Our Plan S-APO series objectives and professional optical system design ensure excellent optical performance, while our frame and base design creates a low gravity, high stability system which reduces vibration commonly experienced during higher magnification observation in industrial environments. Our PA120MET series microscopes are widely used for FPD, LCD, and silicon wafer inspection.

Download: Catalog | Specifications

• German designed 12-inch stage: Seamless Coarse/Fine movement on the stage handle is allowed even with larger and heavier samples. The mechanical stage maintains it's reliability even after long-term use. A maximum stage travel of 305x305mm will allow a 12 inch wafer, LCD or FPD to be imaged and inspected.
• Illumination methods: Various illuminations methods are available - 12V, 100W Halogen Lamp Brightfield Epi illumination; 12V, 100W Halogen Lamp Darkfield Epi illumination. Going from Brightfield to Darkfield has an easy switch that is built into the microscope frame.
• Motorized revolving nosepiece: The motorized nosepiece increases the speed of your workflow. You can select your magnification through either the Buttons on the microscope frame, Software or Controller.
• Motic Analysis Software: Optimized to work intuitively and smoothly with the PA120MET. It is a professional software suite which can be used in both inspection and research environments.

4 models available to meet your needs:

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